In April, Nina Binaei attended SPIE’s Optics and Optoelectronics conference in Prague to present her work on optical contamination monitoring in wire and arc additive manufacturing.
Nina at the SPIE conference and giving her presentation.
In-process optical monitoring of contamination in an additively manufactured titanium alloy
N Binaei, J Hodkinson, K Mullaney, E Chehura, S W Williams, and R P Tatam
Presented at SPIE Optics and Optoelectronics, Prague, Czechia, April 2023