In August, Jonathan Hallam travelled to San Diego to give an invited talk on layer height measurement in laser-additive manufacturing using range resolved interferometry. His work was presented at the Applied Optical Metrology conference, which is a part of SPIE’s Optics and Photonics conference.
The San Diego Convention Centre, venue for Optics and Photonics 2025.
Invited presentation
Range-resolved interferometric layer-height measurement for laser additive manufacturing
J M Hallam, T O H Charrett, T Kissinger, J Qin, W Soder, S Williams and R P Tatam
Proc. SPIE 13603, Applied Optical Metrology VI, 1360309 (2025), San Diego, US;