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SPIE Optical Metrology

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SPIE Optical Metrology

Internationales Congress Center, Munich, Germany

24th - 27th June 2019

SPIE Optical Metrology is part of the World of Photonics congress and is co-located with the Laser: World of Photonics trade show. The symposium will highlight new optical principles and systems for metrology, multimodal sensing, and machine vision with applications in industrial design, production engineering, process monitoring, maintenance support, biotechnology, vehicle navigation, multimedia technology, architecture, archaeology, and arts.

All five Engineering Photonics submissions are part of Optical Measurement Systems for Industrial Inspection XI and the programme can be seen here.

The Neues Rathaus on Marienplatz.

EP Papers

Two-dimensional remote interferometric stage encoder through a single access port using range-resolved interferometry
K Wiseman, T Kissinger, and R P Tatam

Highly accurate displacement measurements using virtually-balanced differential interferometry
T Kissinger and R P Tatam

Absolute angle measurement using dual-wavelength laser speckle for robotic manufacturing
S Gibson, T O H Charrett, and R P Tatam

Multi degree-of-freedom position sensing by combination of laser speckle correlation and range-resolved interferometry
T O H Charrett, T Kissinger, and R P Tatam

The use of parabolic mirrors in combined low-coherence and confocal refractive index measurement
D Francis, J M Hallam, H D Ford, and R P Tatam

 

Key Dates

17th April 2019 : Manuscript submission deadline

3rd June 2019 :  Early-bird registration deadline

 

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