SPIE's biennial Optical Metrology conference was held in Munich in June 2019. Engineering Photonics was represented by Tom Charrett, Dan Francis, Sam Gibson, Thomas Kissinger, and Kieran Wiseman, who all presented within the Optical Measurement Systems for Industrial Inspection sub-conference.
The Neues Rathaus on Marienplatz.
During the opening talk 'Hot Topics in Classical Interferometry' by Peter de Groot of Zygo Coorporation, Thomas Kissinger was highlighted as one the key talks to see. Later, at the Optical Metrology plenary session, former Engineering Photonics research fellow and PhD student Roger Groves was awarded an SPIE fellowship.
Optical Metrology conference reception at the Ratskeller (L-R Thomas, Kieran, Sam, Dan, and Tom).
Roger Groves receiving his SPIE Fellowship at Optical Metrology plenary lecture.
Conference papers
- The use of parabolic mirrors in combined low-coherence and confocal refractive index measurement
D Francis, H D Ford, J M Hallam, and R P Tatam
Presented at Optical Metrology, Munich, Germany, June 2019
Proc. SPIE 11056 Article number 1105610 (2019) - Two-dimensional remote interferometric stage encoder through a single access port using range-resolved interferometry
K Wiseman, T Kissinger, and R P Tatam
Presented at Optical Metrology, Munich, Germany, June 2019
Proc. SPIE 11056 Article number 110560C (2019) - Differential displacement measurements along a single beam using range-resolved interferometry
T Kissinger, and R P Tatam
Presented at Optical Metrology, Munich, Germany, June 2019
Proc. SPIE 11056 Article number 110560E (2019) - Absolute angle measurement using dual-wavelength laser speckle for robotic manufacturing
S J Gibson, T O H Charrett, and R P Tatam
Presented at Optical Metrology, Munich, Germany, June 2019
Proc. SPIE 11056 Article number 110560K (2019) - Multi degree-of-freedom position sensing by combination of laser speckle correlation and range-resolved interferometry
T O H Charrett, T Kissinger, and R P Tatam
Presented at Optical Metrology, Munich, Germany, June 2019
Proc. SPIE 11056 Article number 110563K (2019)