SPIE Optical Metrology: Munich 2019

SPIE's biennial Optical Metrology conference was held in Munich in June 2019. Engineering Photonics was represented by Tom Charrett, Dan Francis, Sam Gibson, Thomas Kissinger, and Kieran Wiseman, who all presented within the Optical Measurement Systems for Industrial Inspection sub-conference.

The Neues Rathaus on Marienplatz.

During the opening talk 'Hot Topics in Classical Interferometry' by Peter de Groot of Zygo Coorporation, Thomas Kissinger was highlighted as one the key talks to see. Later, at the Optical Metrology plenary session, former Engineering Photonics research fellow and PhD student Roger Groves was awarded an SPIE fellowship.

Optical Metrology conference reception at the Ratskeller (L-R Thomas, Kieran, Sam, Dan, and Tom).

Roger Groves receiving his SPIE Fellowship at Optical Metrology plenary lecture.

Conference papers